Metallography Award at NMD-ATM 2019
A Scanning Electron Micrograph prepared by Amit Kumar Singh has won the first prize in the Metallography Contest in the SEM category at the NMD-ATM 2019 held on November 16 at Kovalam (Kerala). This contest was part of the 73rd Annual Technical Meeting of The Indian Institute of Metals. It is indeed a matter of pride for our group.
Amit Singh has been working hard to learn the nuances of the technology and has benefited a lot from teachers like Dr. Manas Paliwal. He strives to get better everyday and has been helping many other students in their research!
Details about the image: Energy Dispersive X-ray (EDX) mapping of additively manufactured Titanium alloy (Ti-6Al-4V) shows the distribution of Ti (green), Al (red), and V (blue) on the Micrograph. The spheres on the micrograph shows the un-melted particle of Ti-6Al-4V alloy deposited using the Electron Beam Melting (EBM). It shows the limitation of EBM as a roughness on the printed specimen.
Congratulations to Amit Singh and Dr. Manas Paliwal for this award! Special thanks to Stefania Franchitti and Antonello Astarita for the material.